Sgecifications
KYOCERA Crystal Device Corporation KBS-5079G
Specifications
Drawing No.
USY1M-H1-16428-00 1 / 11
Issued Date.
Apr,20,2016
Messrs: KED USA
Note: Part Number will be revised in case of specification change.
Product Type
Quartz Crystal
Series
CX2520DB
Frequency
Refer to Doc No.USY1M-H1-16428-00 Page 3/11
Customer Part Number
-
Customer Specification Number
-
KYOCERA Part Number
Refer to Doc No.USY1M-H1-16428-00 Page 3/11
Remarks Pb-Free, RoHS Compliant, MSL 1
Customer Approval
Approval Signature
Approved Date
Department
Person in charge
Manufacturer
KYOCERA Crystal Device Corporation
Crystal Units Division
5850, Higashine-Koh, Higashine-Shi, Yamagata
999-3701 Japan
TEL. No. 0237-43-5611
FAX. No. 0237-43-5615
Design Department
Quality Assurance
Approved by
Checked by
Issued by
KYOCERA Crystal Device Corporation
Crystal Unit Application Engineering Section
Crystal Units Division
S.Itoh
T.Soda
A.Muraoka
Y.Nozaki
Drawing No.
USY1M-H1-16428-00 2 / 11
KYOCERA Crystal Device Corporation KBS-5079G
Revision History
Rev.No.
Description of revise
Date
Approved by
Checked by
Issued by
00
First Edition
Apr,20,2016
T.Soda
A.Muraoka
Y.Nozaki
Drawing No.
USY1M-H1-16428-00 3 / 11
KYOCERA Crystal Device Corporation KBS-5079G
[Parts Number list]
Nominal Frequency
(MHz)
KYOCERA Part Number
ESR
()
Nominal Frequency Code
12.000
CX2520DB12000D0GPSC1
150
12000
13.560
CX2520DB13560D0GPSC1
150
13560
16.000
CX2520DB16000D0GPSC1
80
16000
19.200
CX2520DB19200D0GPSC1
80
19200
20.000
CX2520DB20000D0GPSC1
80
20000
24.000
CX2520DB24000D0GPSC1
80
24000
24.576
CX2520DB24576D0GPSC1
80
24576
25.000
CX2520DB25000D0GPSC1
80
25000
26.000
CX2520DB26000D0GPSC1
60
26000
27.000
CX2520DB27000D0GPSC1
60
27000
30.000
CX2520DB30000D0GPSC1
50
30000
32.000
CX2520DB32000D0GPSC1
50
32000
38.400
CX2520DB38400D0GPSC1
50
38400
40.000
CX2520DB40000D0GPSC1
50
40000
48.000
CX2520DB48000D0GPSC1
50
48000
Referto Doc Nc.USY1M7H1r16428700 Page 3/11
Drawing No.
USY1M-H1-16428-00 4 / 11
KYOCERA Crystal Device Corporation KBS-5079G
1. APPLICATION
The purpose of this document is applied to CX2016DB quartz crystal.
2. KYOCERA PART NUMBER
Refer to Doc No.USY1M-H1-16428-00 Page 3/11
3. RATINGS
Items
SYMB.
Rating
Unit
Remarks
Operating Temperature range
Topr
-40~+85
deg. C
Storage Temperature range
Tstg
-40~+85
deg. C
4. CHARACTERISTICS
4-1 ELECTRICAL CHARACTERISTICS
Items
Electrical Specification
Test Condition
Remarks
SYMB.
Min
Typ.
Max
Unit
Mode of Vibration
Fundamental
Nominal Frequency
F0
(*1)
MHz
Nominal Temperature
TNOM
+25
°C
Load Capacitance
CL
8.0
pF
Frequency Tolerance
df/F
-15.0
+15.0
PPM
+25±3°C
Frequency Temperature
characteristics
df/F
-50.0
+50.0
-40°C ~+85°C
Frequency Ageing Rate
-1.0
+1.0
1ST year
+25±3°C
Equivalent Series
Resistance
ESR
(*2)
Ω
Drive Level
Pd
0.01
100
μW
Insulation Resistance
IR
500
100V(DC)
Measurement Condition
Frequency measurement
Measuring instrument : IEC PI-Network Test Fixture
IEC 60444-8 STD (Pi circuit 41901A)
Equivalent series resistance (ESR) measurement
Measuring instrument : IEC PI-Network Test Fixture
Load Capacitance : Series
*1 *2 Refer to Doc No.USY1M-H1-16428-00 Page 3/11
9 Same.“ 4R0.15 40.66:0.1 ilTl 0Nd+ L modflomd
Drawing No.
USY1M-H1-16428-00 5 / 11
KYOCERA Crystal Device Corporation KBS-5079G
5. APPEARANCES, PHYSICAL DIMENSION
OUTLINE DIMENSION (not to scale)
MARKING
1
Nominal
Frequency
First 5digit of the frequency is indicated. *3
2
Identification
[K] is to indicate 1Pin direction.
3
Date Code
Last 1 Digit of YEAR and WEEK (Ex) 2016,Jan,01 601
4
Manufacturing
Location
YJapan (Yamagata )
ZJapan (Shiga Yohkaichi )
TThailand
*The font of marking is for reference only.
*3 Refer to Doc No.USY1M-H1-16428-00 Page 3/11
PIN
NO.
PIN Layout
#1
HOT
#2
GND
#3
HOT
#4
GND(NC)
UNIT: mm
0.50±0.05
3
2.00±0.10
2.50±0.10
4-R0.15
4-0.66±0.1
4-0.56±0.10
C 0.20
4-0.20
2
2 6 0 0 0
K 6 0 1 Z
4
#1
#3
#4
#2
#3 HOT
#1
1
8-0.115
#2 GND
#1 HOT
#4 GND
#4
#3
#2
GND
(NC)
GND
(Top View)
(Side View)
(Bottom View)
(TOP VIEW)
(Connection)
Drawing No.
USY1M-H1-16428-00 6 / 11
KYOCERA Crystal Device Corporation KBS-5079G
6. RECOMMENDED LAND PATTERN (not to scale)
UNIT: mm
1.0
1.0
0.3
1.2
1.2
0.5
1.7
1.3
23510.1 <_ ‘l="" ‘l="" 40:01="" 7="" 9="" lcj="" g="" e="" 9="" e="" n="" o="" o="" 2851010="" 165k180”="" :/="" @="" c="" 400~560mm="">
Drawing No.
USY1M-H1-16428-00 7 / 11
KYOCERA Crystal Device Corporation KBS-5079G
7. TAPING&REEL
7-1.Dimensions
7-2.Leader and trailer tape
7-3.Direction(The direction shall be seen from the top cover tape side)
7-4.Specification
1. Material of the carrier tape is either polystyrene or A-PET (ESD).
2. Material of the cover tape is polyester (ESD).
3. The seal tape shall not cover the sprocket holes and not protrude from the carrier tape.
4. Tensile strength of carrier tape: 10N or more.
5. The R of the corner of each cavity is 0.2RMAX.
6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less.
7. The orientation shall be checked from the top cover tape side as shown in 8-3.
8. Peeling force of cover tape: 0.1 to 1.0N.
9. The component will fall out naturally when cover tape is removed and set upside down.
Leader
Empty compartment
Empty compartment
Component
END
START
160mm or more
100~200mm
400~560mm
Unreeling direction
12345
K123 Z
12345
K123 Z
12345
K123 Z
12345
K123 Z
165°~180°
Cover tape
Career tape
0.1
0
4.0±0.1
1.5
1.05±0.05
2.0±0.05
Unreeling direction
8.0±0.2
1.75±0.1
3.0.05
2.85±0.10
2.35±0.1
4.0±0.1
0.2±0.05
0.6±0.05
Drawing No.
USY1M-H1-16428-00 8 / 11
KYOCERA Crystal Device Corporation KBS-5079G
7-5.Reel Specification
180 Reel (3,000 pcs Max.)
Symbol
A
B
C
Dimension
180 +0/-3
60 +1/-0
13±0.2
Symbol
D
E
W
Dimension
21±0.8
2.0±0.5
9±1
(Unit: mm)
330 Reel (12,000 pcs Max.)
Symbol
A
B
C
Dimension
332.0
101.0
13±0.2
Symbol
D
E
W
Dimension
21±0.8
2.0±0.5
9.5±0.5
(Unit: mm)
A
C
D
E
B
W
Drawing No.
USY1M-H1-16428-00 9 / 11
KYOCERA Crystal Device Corporation KBS-5079G
8. Enviromental requirements
After conducting the following tests, component needs to meet below conditions.
Frequency: Fluctuation within +/-10 x 10-6
CI: Fluctuation within +/-20% or 5Ω whichever is larger
8.1 Resistance to Shock Test condition
3 times natural drop from 100cm onto hard wooden board.
8.2 Resistance to Vibration Test condition
frequency : 10 - 55 - 10 Hz
Amplitude : 1.5mm
Cycle time : 15 minutes
Direction : X,Y,Z (3direction),2h each.
8.3 Resistance to Heat Test condition
The quartz crystal unit shall be stored at a
temperature of +852°C for 500h and subjected to
room temperature for 1h before measurement.
8.4 Resistance to Cold Test condition
The quartz crystal unit shall be stored at a
temperature of -402°C for 500h and subjected to
room temperature for 1h before measurement.
8.5 Thermal Shock Test condition
The quartz crystal unit shall be subjected to 500 temperature
cycles shown in table below,Then it shall be subjected
to room temperature for 1h before mesurement.
Cycle :-402°C (30min.) +252°C(5min.)
+852°C(30min.) +252°C(5min.)
N m H
Drawing No.
USY1M-H1-16428-00 10 / 11
KYOCERA Crystal Device Corporation KBS-5079G
8.6 Resistance to Moisture Test condition
The quartz crystal unit shall be stored at a
temperature of +602°C with relative humidity of
90% to 95% for 240 h. Then it shall be subjected
to room temperature for 1h before measurement.
8.7 Soldering condition 1.) Type of solder
Material lead free solder paste
Melting point +2205°C
2.) Reflow temp.profile
Frequency shift : 2ppm
3.) Hand Soldering +350°C 3 sec max
4.) Reflow Times 2 times in below Reflow temp. profile
Reflow temp.profile
8.8 Bending Strength
Solder this product in center of the circuit board (40mm X 100mm),
and add deflection of 3mm.
Test board : t=1.6mm
Temp [°C]
Time[sec]
Preheating
+150 to +180
150 (typ.)
Peak
+2605
10 (max.)
Total
---
300 (max.)
20
PUSH
board
10
1.6
R5
R230
Product
Press jig
UNIT: mm
45
45
Drawing No.
USY1M-H1-16428-00 11 / 11
KYOCERA Crystal Device Corporation KBS-5079G
9. Cautions for use
(1)Soldering upon mounting
There is a possibility to influence product characteristics when Solder paste or conductive glue comes in
contact with product lid or surface.
(2)When using mounting machine
Please minimize the shock when using mounting machine to avoid any excess stress to the product.
(3)Conformity of a circuit
We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 5 times the
ESR (Equivalent Series Resistance) of crystal unit.
10. Storage conditions
Please store product in below conditions, and use within 6 months.
Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition.
11. Manufacturing location
Kyocera Crystal Device Corporation Yamagata Plant
Kyocera Crystal Device Corporation Shiga Yohkaichi Plant
Kyocera Crystal Device (Thailand) Co., Ltd
12. Quality Assurance
To be guaranteed by Kyocera Crystal Device Quality Assurance Division
13. Quality guarantee
In case when Kyocera Crystal Device Corporation rooted failure occurred within 1year after its delivery,
substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery is
waivered.
14. Others
In case of any questions or opinions regarding the Specification, please have it in written manner
within 45 days after issued date.